Cho, Moon JuMoon JuChoSpessot, AlessioAlessioSpessotKaczer, BenBenKaczerAoulaiche, MarcMarcAoulaicheRitzenthaler, RomainRomainRitzenthalerSchram, TomTomSchramFazan, PierrePierreFazanHoriguchi, NaotoNaotoHoriguchiLinten, DimitriDimitriLinten2021-10-222021-10-222015-06https://imec-publications.be/handle/20.500.12860/25079Off-state stress degradation mechanism on advanced p-MOSFETsProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7165893