Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs

Nafaa, B.B.NafaaCretu, B.B.CretuIsmail, N.N.IsmailTouayar, O.O.TouayarSimoen, EddyEddySimoen2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29055Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETsProceedings paperhttps://ieeexplore.ieee.org/document/7962610/