60 MeV proton irradiation effects on NO-annealed and standard-oxide deep submicron MOSFETs

Simoen, EddyEddySimoenHermans, JanJanHermansVereecken, WimWimVereeckenVermoere, CarlCarlVermoereClaeys, C.C.ClaeysAugendre, EmmanuelEmmanuelAugendreBadenes, GonçalGonçalBadenesMohammadzadeh, A.A.Mohammadzadeh2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/566460 MeV proton irradiation effects on NO-annealed and standard-oxide deep submicron MOSFETsOral presentation