Bronckers, StephaneStephaneBronckersScheir, KarenKarenScheirVandersteen, GerdGerdVandersteenVan der Plas, GeertGeertVan der PlasRolain, YvesYvesRolain2021-10-172021-10-1720090278-0070https://imec-publications.be/handle/20.500.12860/15044A methodology to predict the impact of substrate noise in analog/RF systemsJournal article