Inline edge illumination X-ray phase contrast imaging through mask misalignment

Francken, NicholasNicholasFranckenSanctorum, JonathanJonathanSanctorumSanctorum, JoaquimJoaquimSanctorumVanthienen, Pieter-JanPieter-JanVanthienenSijbers, JanJanSijbersDe Beenhouwer, JanJanDe Beenhouwer2024-11-062024-09-102024-11-0620241094-4087WOS:001304623800001https://imec-publications.be/handle/20.500.12860/44457Inline edge illumination X-ray phase contrast imaging through mask misalignmentJournal article10.1364/OE.525730WOS:001304623800001