Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress

Millesimo, M.M.MillesimoBorga, MatteoMatteoBorgaValentini, L.L.ValentiniBakeroot, B.B.BakerootPosthuma, NielsNielsPosthumaVohra, AnuragAnuragVohraDecoutere, StefaanStefaanDecoutereFiegna, C.C.FiegnaTallarico, A. N.A. N.Tallarico2023-12-072023-09-232023-12-0720230018-9383WOS:001063640800001https://imec-publications.be/handle/20.500.12860/42584Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating StressJournal article10.1109/TED.2023.3304272WOS:001063640800001ALGAN/GAN HEMTSNONEXPONENTIAL TRANSIENTSCURRENT COLLAPSECARBONIMPACTMECHANISMSBREAKDOWNVOLTAGESTATESMODEL