Ohyama, H.H.OhyamaSakamoto, K.K.SakamotoSukizaki, H.H.SukizakiTakakura, K.K.TakakuraHayama, K.K.HayamaMotoki, M.M.MotokiMatsuo, K.K.MatsuoNakamura, H.H.NakamuraSawada, M.M.SawadaMidorikawa, M.M.MidorikawaKuboyama, S.S.KuboyamaDe Jaeger, BriceBriceDe JaegerSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-1720081369-8001https://imec-publications.be/handle/20.500.12860/14242Radiation damage of Ge-on-Si devicesJournal article