Alawneh, IsamIsamAlawnehSimoen, EddyEddySimoenBiesemans, SergeSergeBiesemansDe Meyer, KristinKristinDe MeyerClaeys, CorCorClaeys2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2336Characteristics of deep submicron n-MOSFETs in the temperature range 4.2 - 300 KMeeting abstract