Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETs

Cretu, BogdanBogdanCretuTahiat, AbderrahimAbderrahimTahiatVeloso, AnabelaAnabelaVelosoSimoen, EddyEddySimoen2025-04-242024-09-222025-04-2420240018-9383WOS:001312036800001https://imec-publications.be/handle/20.500.12860/44561Refined Analysis of the Correlated Carrier Number and Mobility Fluctuations Mechanism in MOSFETsJournal article10.1109/TED.2024.3445310WOS:001312036800001LOW-FREQUENCY NOISEFLICKER NOISESERIES-RESISTANCE1/F NOISEEXTRACTIONNMOSFETSFINFET