Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices

Martens, KoenKoenMartensWang, WenfeiWenfeiWangdimoulas, A.A.dimoulasBorghs, GustaafGustaafBorghsMeuris, MarcMarcMeurisGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12561Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devicesJournal article