Radiation source dependence of degradation and recovery of irradiated Si1-xGex epitaxial devices

Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaSunaga, H.H.SunagaPoortmans, JefJefPoortmansCaymax, MattyMattyCaymax2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1389Radiation source dependence of degradation and recovery of irradiated Si1-xGex epitaxial devicesProceedings paper