Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization

Moens, P.P.MoensConstant, A.A.ConstantStockman, ArnoArnoStockmanFranchi, J.J.FranchiAllerstam, F.F.Allerstam2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33599Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterizationProceedings paperhttps://ieeexplore.ieee.org/document/8757560