Kilchytska, ValeriaValeriaKilchytskaAlvarado, J.J.AlvaradoCollaert, NadineNadineCollaertRooyackers, RitaRitaRooyackersPut, SofieSofiePutClaeys, CorCorClaeysFlandre, DenisDenisFlandre2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17369Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETsProceedings paper