Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio

Kulkarni, S.R.S.R.KulkarniSchrimpf, R.D.R.D.SchrimpfGalloway, K.F.K.F.GallowayClaeys, CorCorClaeysSimoen, EddyEddySimoen2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13967Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratioProceedings paper