De Wachter, BartBartDe WachterMarinissen, Erik JanErik JanMarinissenFodor, FerencFerencFodorHiblot, GaspardGaspardHiblot2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28177Parametric test for next generation semiconductor technologiesMeeting abstract