Eyben, PierrePierreEybenDuhayon, NatasjaNatasjaDuhayonClarysse, TrudoTrudoClarysseVandervorst, WilfriedWilfriedVandervorst2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5285Bias-induced junction displacements in SSRM and SCMMeeting abstract