Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors

Moens, P.P.MoensVan den Bosch, GeertGeertVan den BoschGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7907Competing hot carrier degradation mechanisms in lateral n-type DMOS transistorsProceedings paper