Effect of shallow junction on the extraction of the minority carrier recombination lifetime from forward diode characteristics

Poyai, AmpornAmpornPoyaiSimoen, EddyEddySimoenClaeys, CorCorClaeysGaubas, EugenijusEugenijusGaubas2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6738Effect of shallow junction on the extraction of the minority carrier recombination lifetime from forward diode characteristicsMeeting abstract