Waltl, MichaelMichaelWaltlGrill, AlexanderAlexanderGrillRzepa, GerhardGerhardRzepaGoes, WolfgangWolfgangGoesFranco, JacopoJacopoFrancoKaczer, BenBenKaczerMitard, JeromeJeromeMitardGrasser, TiborTiborGrasser2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27564Nanoscale evidence for the superior reliability of SiGe high-k pMOSFETsProceedings paperhttps://ieeexplore.ieee.org/document/7574644