O'Sullivan, BarryBarryO'SullivanRitzenthaler, RomainRomainRitzenthalerSimoen, EddyEddySimoenDentoni Litta, EugenioEugenioDentoni LittaSchram, TomTomSchramVaisman Chasin, AdrianAdrianVaisman ChasinLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchiMachkaoutsan, VladimirVladimirMachkaoutsanFazan, PierrePierreFazanLi, YYLi2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29122Gate stack engineering to enhance high- $j/metal gate reliability for DRAM I/O applicationsProceedings paperhttp://ieeexplore.ieee.org/document/7936365/