Stoffels, SteveSteveStoffelsMélotte, MichelMichelMélotteHaussy, MagaliMagaliHaussyVenegas, RafaelRafaelVenegasMarcon, DenisDenisMarconVan Hove, MarleenMarleenVan HoveDecoutere, StefaanStefaanDecoutere2021-10-212021-10-2120130018-9499https://imec-publications.be/handle/20.500.12860/23128Stability evaluation of insulated gate AlGaN/GaN power switching devices under heavy ion irradiationJournal article