Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions

Wu, LizhouLizhouWuRao, SiddharthSiddharthRaoTaouil, MottaqiallahMottaqiallahTaouilMarinissen, Erik JanErik JanMarinissenKar, Gouri SankarGouri SankarKarHamdioui, SaidSaidHamdioui2022-05-032022-05-012022-05-032022-05-0320211089-3539WOS:000783792400016https://imec-publications.be/handle/20.500.12860/39719Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test SolutionsProceedings paper10.1109/ITC50571.2021.00022978-1-6654-1695-5WOS:000783792400016Electrical & electronic engineeringSTT-MRAM, MRAM, testing, embedded memory