An analysis of the NBTI-induced threshold voltage shift evaluated by different techniques

Ji, ZhigangZhigangJiZhang, Jian FuJian FuZhangChang, Mo HuaiMo HuaiChangKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-172009-050018-9383https://imec-publications.be/handle/20.500.12860/15542An analysis of the NBTI-induced threshold voltage shift evaluated by different techniquesJournal article