Van De Sande, WielandWielandVan De SandeAlavi, OmidOmidAlaviNivelle, PhilippePhilippeNivelleD'Haen, JanJanD'HaenDaenen, MichaëlMichaëlDaenen2021-10-292021-10-2920201996-1073https://imec-publications.be/handle/20.500.12860/36128Thermo-mechanical stress comparison of a GaN and SiC MOSFET for photovoltaic applicationsJournal articlehttps://doi.org/10.3390/en13225900