Franco, JacopoJacopoFrancoWu, ZhichengZhichengWuRzepa, GerhardGerhardRzepaVandooren, AnneAnneVandoorenArimura, HiroakiHiroakiArimuraRagnarsson, Lars-AkeLars-AkeRagnarssonHellings, GeertGeertHellingsBrus, StephanStephanBrusCott, DaireDaireCottDe Heyn, VincentVincentDe HeynGroeseneken, GuidoGuidoGroesenekenHoriguchi, NaotoNaotoHoriguchiRyckaert, JulienJulienRyckaertCollaert, NadineNadineCollaertLinten, DimitriDimitriLintenGrasser, TiborTiborGrasserKaczer, BenBenKaczer2021-10-252021-10-252018-12https://imec-publications.be/handle/20.500.12860/30725BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integrationProceedings paperhttps://ieeexplore.ieee.org/document/8614559