Trapping and reliability assessment in d-mode GaN-based MIS-HEMTs for power applications

Meneghini, MatteoMatteoMeneghiniBisi, DavideDavideBisiMarcon, DenisDenisMarconStoffels, SteveSteveStoffelsVan Hove, MarleenMarleenVan HoveWu, Tian-LiTian-LiWuDecoutere, StefaanStefaanDecoutereMeneghesso, GaudenzioGaudenzioMeneghessoZanoni, EnricoEnricoZanoni2021-10-222021-10-2220140885-8993https://imec-publications.be/handle/20.500.12860/24240Trapping and reliability assessment in d-mode GaN-based MIS-HEMTs for power applicationsJournal articlehttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6558779