Zhang, Cher XuangCher XuangZhangFrancis, Sarah AshleySarah AshleyFrancisZhang, En XiaEn XiaZhangFleetwood, Daniel M.Daniel M.FleetwoodSchrimpf, Ronald D.Ronald D.SchrimpfGalloway, Kenneth F.Kenneth F.GallowaySimoen, EddyEddySimoenMitard, JeromeJeromeMitardClaeys, CorCorClaeys2021-10-192021-10-1920110018-9499https://imec-publications.be/handle/20.500.12860/20197Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETsJournal article