Single-event induced charge collection in Ge-channel pMos FinFETs

Rony, M.W.M.W.RonySamsel, IsaakIsaakSamselZhang, En XiaEn XiaZhangSternberg, AndrewAndrewSternbergLi, KanKanLiReaz, MahumedMahumedReazAustin, StephanieStephanieAustinReed, RobertRobertReedFleetwood, RobertRobertFleetwoodAlles, MikeMikeAllesLinten, DimitriDimitriLintenMitard, JeromeJeromeMitardSchrimpf, RonaldRonaldSchrimpf2021-10-292021-10-292020-07https://imec-publications.be/handle/20.500.12860/35854Single-event induced charge collection in Ge-channel pMos FinFETsProceedings paperhttp://www.nsrec.com/2020_session-e.html