Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity

Gaubas, EugenijusEugenijusGaubasVaitkus, J.J.VaitkusSimoen, EddyEddySimoenClaeys, C.C.ClaeysVanhellemont, JanJanVanhellemont2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5310Excess carrier cross-sectional profiling technique for determination of the surface recombination velocityJournal article