Electron-irradiation effects of CMOS integrated circuits with leakage current compensation

Hayama, KiyoteruKiyoteruHayamaOhyama, HidenoriHidenoriOhyamaSimoen, EddyEddySimoenClaeys, CorCorClaeysTakizawa, H.H.Takizawa2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4421Electron-irradiation effects of CMOS integrated circuits with leakage current compensationProceedings paper