Dehaerne, EnriqueEnriqueDehaerneDey, BappadityaBappadityaDeyHalder, SandipSandipHalderDe Gendt, StefanStefanDe Gendt2024-04-172023-07-282023-07-312024-04-172023978-1-5106-6099-10277-786XWOS:001022962000068https://imec-publications.be/handle/20.500.12860/42216Optimizing YOLOv7 for Semiconductor Defect DetectionProceedings paper10.1117/12.2657564978-1-5106-6100-4WOS:001022962000068