Watté, J.J.WattéSilverans, R. E.R. E.SilveransMünder, H.H.MünderPalmstrøm, C. J.C. J.PalmstrømFlorez, L. T.L. T.FlorezVan Hove, MarleenMarleenVan HoveBorghs, GustaafGustaafBorghsWuyts, KoenKoenWuyts2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/456The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopyProceedings paper