Poyai, AmpornAmpornPoyaiSimoen, EddyEddySimoenClaeys, CorCorClaeysGaubas, EugenijusEugenijusGaubasCzerwinski, A.A.Czerwinski2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2879Analysis of the diffusion currrent in cobalt silicided n+p junctionsMeeting abstract