Makarov, AlexanderAlexanderMakarovKaczer, BenBenKaczerVaisman Chasin, AdrianAdrianVaisman ChasinVandemaele, MichielMichielVandemaeleGrill, AlexanderAlexanderGrillHellings, GeertGeertHellingsEl-Sayed, Al-MoatasemAl-MoatasemEl-SayedGrasser, TiborTiborGrasserLinten, DimitriDimitriLintenTyaginov, StanislavStanislavTyaginov2021-10-272021-10-2720190741-3106https://imec-publications.be/handle/20.500.12860/33513Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approachJournal articlehttps://ieeexplore.ieee.org/document/8790803