Ke, Tung HueiTung HueiKeMalinowski, PawelPawelMalinowskiNakamura, AtsushiAtsushiNakamuraVander Velpen, DieterDieterVander VelpenVandenplas, ErwinErwinVandenplasHeremans, PaulPaulHeremans2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/31031Investigation of OLED characteristics evolution under sequential photolithography patterning processesOral presentation