Haertler, C.C.HaertlerGolze, U.U.GolzeSikula, J.J.SikulaSikulova, M.M.SikulovaHruska, P.P.HruskaVasina, PetrPetrVasinaClaeys, CorCorClaeysSimoen, EddyEddySimoen2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1248Transition probabilities and noise spectra in submicron MOSFETsProceedings paper