Schulze, AndreasAndreasSchulzeCao, RupingRupingCaoEyben, PierrePierreEybenHantschel, ThomasThomasHantschelVandervorst, WilfriedWilfriedVandervorst2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/23057Outwitting the series resistance in scanning spreading resistance microscopyMeeting abstract