Stockman, ArnoArnoStockmanCanato, EleonoraEleonoraCanatoMeneghini, MatteoMatteoMeneghiniMeneghesso, GaudenzioGaudenzioMeneghessoMoens, PeterPeterMoensBakeroot, BenoitBenoitBakeroot2022-02-222022-02-2220211530-4388WOS:000659548400002https://imec-publications.be/handle/20.500.12860/38974Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTsJournal article10.1109/TDMR.2021.3080585WOS:000659548400002SHIFT