Xie, DuanDuanXieSimoen, EddyEddySimoenChen, HaifengHaifengChenArimura, HiroakiHiroakiArimuraHoriguchi, NaotoNaotoHoriguchi2021-10-292021-10-2920200018-9383https://imec-publications.be/handle/20.500.12860/36367Impact of dummy gate removal and a silicon cap on the noise performance of germanium nFinFETsJournal articlehttps://ieeexplore.ieee.org/document/9186827