Chen, JiaheJiaheChenVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenLauwaert, JohanJohanLauwaertVrielinck, HenkHenkVrielinckRafi, Joan MarcJoan MarcRafiOhyama, HidenoriHidenoriOhyamaWeber, JorgJorgWeberYang, DerenDerenYang2021-10-192021-10-1920111610-1634https://imec-publications.be/handle/20.500.12860/18660Electron irradiation induced defects in germanium-doped Czochralski silicon substrates and diodesJournal article