Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

Michl, JakobJakobMichlGrill, AlexanderAlexanderGrillWaldhoer, DominicDominicWaldhoerGoes, WolfgangWolfgangGoesKaczer, BenBenKaczerLinten, DimitriDimitriLintenParvais, BertrandBertrandParvaisGovoreanu, BogdanBogdanGovoreanuRadu, IulianaIulianaRaduGrasser, TiborTiborGrasserWaltl, MichaelMichaelWaltl2022-08-312021-12-162022-05-302022-06-232022-06-242022-08-3120210018-9383WOS:000724501000067https://imec-publications.be/handle/20.500.12860/38620Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: ExperimentalJournal article10.1109/TED.2021.3117740WOS:000724501000067THRESHOLD VOLTAGEDEFECTS