Acurio, ElianaElianaAcurioTrojman, LionelLionelTrojmanDe Jaeger, BriceBriceDe JaegerBakeroot, BenoitBenoitBakerootDecoutere, StefaanStefaanDecoutere2022-03-112022-03-1120211541-7026WOS:000672563100074https://imec-publications.be/handle/20.500.12860/39417ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectricProceedings paper10.1109/IRPS46558.2021.9405163978-1-7281-6893-7WOS:000672563100074HEMTSBREAKDOWN