Radiation defects in Sti silicon diodes and their effects on device performance

Hayama, KiyoteruKiyoteruHayamaOhyama, HidenoriHidenoriOhyamaSimoen, EddyEddySimoenClaeys, CorCorClaeysPoyai, AmpornAmpornPoyaiMiura, T.T.MiuraKobayashi, K.K.Kobayashi2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5336Radiation defects in Sti silicon diodes and their effects on device performanceJournal article