Study of time-dependent degradation of reverse biased AlGaN/GaN HEMTs

Stocco, AntonioAntonioStoccoMeneghini, MatteoMatteoMeneghiniBertin,BertinMarcon, DenisDenisMarconMeneghesso, GaudenzioGaudenzioMeneghessoZanoni, EnricoEnricoZanoni2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21559Study of time-dependent degradation of reverse biased AlGaN/GaN HEMTsMeeting abstract