Zborowski, CharlotteCharlotteZborowskiConard, ThierryThierryConardVanleenhove, AnjaAnjaVanleenhoveHoflijk, IlseIlseHoflijkVaesen, IngeIngeVaesen2022-11-152022-09-242022-11-1520221055-5269WOS:000855175500005https://imec-publications.be/handle/20.500.12860/40502Reference survey spectra of elemental solid measured with Cr K-alpha photons as a tool for Quases analysis (4): Group III and IV elements (B, Al, In, C, Si, Ge, Sn, Pb)Journal article10.1116/6.0001955WOS:000855175500005INELASTIC BACKGROUND ANALYSISHAXPESXPSQUANTIFICATION