Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

Tartarin, Jean-GuyJean-GuyTartarinSoubercaze-Pun, GeoffeyGeoffeySoubercaze-PunRennane, AbdelaliAbdelaliRennaneBary, LaurentLaurentBaryPlana, RobertRobertPlanaDe Jaeger, Jean C.Jean C.De JaegerGermain, MarianneMarianneGermainDelage, SylvainSylvainDelageGraffeuil, JacquesJacquesGraffeuil2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9667Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure predictionProceedings paper