Vandervorst, WilfriedWilfriedVandervorstEyben, PierrePierreEybenDuhayon, NatasjaNatasjaDuhayonFouchier, MarcMarcFouchierXu, MingweiMingweiXu2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6986Two-dimensional carrier profiling using scanning probesOral presentation