Crupi, I.I.CrupiDegraeve, RobinRobinDegraeveGovoreanu, BogdanBogdanGovoreanuBrunco, DavidDavidBruncoRoussel, PhilippePhilippeRousselVan Houdt, JanJanVan Houdt2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/11930Distribution and generation of traps in SiO2/Al2O3 gate stacksJournal article