Putcha, VamsiVamsiPutcha2021-10-272021-10-272019-02https://imec-publications.be/handle/20.500.12860/33836Reliability characterization of gate-stacks for III-V channel MOSFETsPHD thesishttps://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS2363730&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1