Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors

Croes, KristofKristofCroesSimons, VeerleVeerleSimonsTruijen, BrechtBrechtTruijenRoussel, PhilippePhilippeRousselVan Sever, KoenKoenVan SeverTsiara, ArtemisiaArtemisiaTsiaraFranco, JacopoJacopoFrancoAbsil, PhilippePhilippeAbsil2023-04-282022-08-052023-04-282022naWOS:000828152500413https://imec-publications.be/handle/20.500.12860/40205Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectorsProceedings paper978-1-55752-466-9WOS:000828152500413